Swift Reliability Test Methodology of 100G High-Speed, Energy-efficient Electro-Absorption Modulated Lasers (EML) for Green Datacenter Networks

Jack Jia-Sheng Huang, Yu-Heng Jan, Jesse Chang, Yi-Ching Hsu, Dawei Ren, Emin Chou

Abstract


High-speed transceivers are receiving great interest due to the demand for huge data traffic and information storage capacities in the Big Data era. Recently, 100 Gigabit Ethernet (100GbE) has become an IEEE standardized data communication protocol. The 100G quad small form-factor pluggable (QSFP) transceiver is one of the key technological enablers in the high-speed optical networks. In this paper, we study the reliability current dependence for the four-lambda QSFP (4x25G) EML devices that are employed in the 100G QSFP transceivers. In order to meet the energy-efficient and environmental requirements, we develop a swift reliability test methodology that can provide fast, accurate reliability assessment to ensure robust long-term field performance. We discuss the acceleration factor and extrapolation for the energy-efficient reliability test.


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DOI: https://doi.org/10.11114/set.v3i1.1727

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Studies in Engineering and Technology   ISSN 2330-2038 (Print)   ISSN 2330-2046 (Online)

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