Short- And Long-Term Value-At-Risk, Skewness, Kurtosis and Coherent Risk Measure

Weiping Li, Guotai Chi, Bin Meng

Abstract


Standard risk management focuses on short-run risks rather than longer periods. We introduce an improved risk measure which can be used to estimate both short-and long-term structure of value at risk and the corresponding expected shortfall. The short- and long-term coherent measure of risk is specified and computed for both S&P 500, HSI and SHSZ 300. We also test long-term skewness and kurtosis from empirical analysis for S&P 500, HSI and SHSZ 300. We also show that our improved risk measure gives a better estimate of the value at risk for short horizons and never decreases to negative values like VaR for long-run horizons. Both long-term skewness and kurtosis for HSI and SHSZ 300 are analyzed empirically.


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DOI: https://doi.org/10.11114/aef.v3i3.1528

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Applied Economics and Finance    ISSN 2332-7294 (Print)   ISSN 2332-7308 (Online)

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